Patents Assigned to Mitutoyo Corporation
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Publication number: 20240149461Abstract: A foolproof device provided to a manufacturing process includes an imaging part that captures an object on which a plurality of identifiable marks are provided, an image processing part that obtains state data including a coordinate position of each mark from at least one captured image captured by the imaging part, a storage that stores reference data obtained by the image processing part, the reference data including a reference position of each mark, and a comparison processing part that compares the reference data stored in the storage with the current state data obtained by the image processing part, and outputs a result of the comparison regarding at least some of the plurality of marks.Type: ApplicationFiled: November 3, 2023Publication date: May 9, 2024Applicant: MITUTOYO CORPORATIONInventors: Akira TAKADA, Mitsuru FUKUDA, Hirotada ANZAI, Eran YERUHAM, Yuval YERUHAM, David BUNIMOVICH
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Publication number: 20240151506Abstract: An automatic measuring apparatus includes an inside-diameter measuring unit that measures the inside diameter of a workpiece, a robot arm part, and a control unit. The inside-diameter measuring unit is installed with the tip side facing upward. A cone-shaped guide cone is provided at the tip of the inside-diameter measuring unit. A workpiece stopper is attached to the outside of the inside-diameter measuring unit. A support surface, which serves as a placing surface on which the workpiece is placed, is supported by a spring, and the inclination and position of the support surface changes to follow a change in the posture and position of the workpiece.Type: ApplicationFiled: October 31, 2023Publication date: May 9, 2024Applicant: MITUTOYO CORPORATIONInventors: Yuhei TAKATSU, Masashi YAMAJI, Yuya ARASHI, Chihiro YAMAMOTO, Shuji HAYASHIDA
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Publication number: 20240142214Abstract: There is provided a measuring device that is inexpensive and easy to use, yet provides sufficient accuracy and resolution in continuous scanning measurement to measure workpiece surfaces. A dial gauge includes a spindle provided to be movable reciprocatively in an axial direction through a main body case. The main body case includes a stem provided to protrude from a side face of the main body case. A ball bearing that bears the spindle is provided inside the stem. A workpiece and the dial gage are relatively moved while a contact point at the tip of the spindle is in contact with the surface of the workpiece, and continuous scanning measurement is performed to measure irregularities of the surface of the workpiece or the amount of runout of the rotating workpiece.Type: ApplicationFiled: October 31, 2023Publication date: May 2, 2024Applicant: MITUTOYO CORPORATIONInventors: Takumi MAKINO, Mao KIKUCHI, Tomoharu KURATA
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Publication number: 20240133666Abstract: A small-sized measuring device includes a position detector that is provided on a main body and detects the position of an object to be measured, a photosensor, and a central control unit that controls overall operation. The photosensor is configured to function at least as an input device configured to accept a base-point setting instruction from the user. The central control unit, when accepting the base-point setting instruction from the user through the non-contact input sensor, performs a base-point setting step of setting the position of the object to be measured detected by the position detector as a base point, and performs a measurement step of measuring the position of the object to be measured as a relative position from the base point.Type: ApplicationFiled: October 16, 2023Publication date: April 25, 2024Applicant: MITUTOYO CORPORATIONInventors: Mao KIKUCHI, Tomoharu KURATA
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Publication number: 20240133667Abstract: A small-sized measuring device includes a position detector that is provided on a main body and detects the position of an object to be measured, a timer that measures time, and a central control unit that controls overall operation. The central control unit accepts a base-point setting standby time set by a user and stores the base-point setting standby time. The central control unit measures elapse of the base-point setting standby time after accepting an instruction to start measuring time from the user, performs a base-point setting step of setting the position of the object to be measured detected by the position detector as a base point after the base-point setting standby time has elapsed, and then measures the position of the object to be measured as a relative position from the base point.Type: ApplicationFiled: October 16, 2023Publication date: April 25, 2024Applicant: MITUTOYO CORPORATIONInventors: Mao KIKUCHI, Tomoharu KURATA
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Patent number: 11965733Abstract: An optical sensor includes a radiation part that irradiates an object to be measured with laser light, an imaging part that receives laser light reflected by the object to be measured and captures an image of the object to be measured, a first driving part that moves the radiation part in a radiation direction of laser light to the object to be measured, and a second driving part that moves the imaging part in a reflection direction of laser light from the object to be measured and an orthogonal direction to the reflection direction.Type: GrantFiled: April 15, 2022Date of Patent: April 23, 2024Assignee: MITUTOYO CORPORATIONInventors: Takamitsu Watanabe, Kentaro Nemoto, Yoshihiko Sugita
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Patent number: 11948321Abstract: A three-dimensional geometry measurement apparatus including: a preliminary measurement part that creates a plurality of pieces of preliminary measurement data indicating three-dimensional coordinates of a reference point on a reference instrument; a reference data creation part that creates reference data; a calculation part that calculates a correction value on the basis of the reference data and the preliminary measurement data which does not match the reference data; a target measuring part that creates target measurement data indicating results of measuring a measurement point of the object to be measured; a correction part that corrects the target measurement data in the measurement system corresponding to the preliminary measurement data that does not match the reference data, on the basis of the correction value; and a geometry identification part that identifies a geometry of the object to be measured using the corrected target measurement data.Type: GrantFiled: November 30, 2020Date of Patent: April 2, 2024Assignee: MITUTOYO CORPORATIONInventor: Kaoru Miyata
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Publication number: 20240077292Abstract: A one dimensional measuring machine includes a scale having graduations, a mover that has a light source configured to emit light to the graduations of the scale and a light receiving element configured to receive the light having passed through the scale from the light source, and can move along the scale, a light amount information detector that detects information regarding a light amount of the light emitted to the scale from the light source while the mover moves along the scale, and a contamination detector that detects a degree of contamination of the scale, based the information regarding the light amount of the light detected by the light amount information detector.Type: ApplicationFiled: August 16, 2023Publication date: March 7, 2024Applicant: MITUTOYO CORPORATIONInventor: Ryunosuke YANO
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Patent number: 11924938Abstract: An illuminator includes: a light emitter including a light-emitting diode; a temperature sensor configured to detect a current temperature of the light emitter; and an illumination controller configured to adjust a drive voltage being supplied to the light emitter in accordance with the current temperature. The illumination controller includes a reference temperature storage in which a reference temperature is stored in advance and is configured to adjust the drive voltage by detecting the current temperature from the temperature sensor on a constant time cycle and comparing the current temperature with the reference temperature.Type: GrantFiled: June 13, 2022Date of Patent: March 5, 2024Assignee: MITUTOYO CORPORATIONInventors: Tadashi Yamazaki, Yuto Konno, Hideki Morita, Nobuya Kaneko, Satoru Hirasawa
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Patent number: 11892362Abstract: There is provided a measuring device (dial gauge) capable of performing measurement with a desired measuring force regardless of the posture of the measuring device. A dial gauge in an exemplary embodiment of the present invention includes a measuring force adjustment unit provided to a body case and capable of moving and being positioned and fixed in a direction substantially parallel to a moving direction of a spindle. A biasing means has one end directly or indirectly engaged with the spindle and the other end directly or indirectly engaged with the measuring force adjustment unit, and biases the spindle toward a tip end. The measuring force adjustment unit includes an external thread portion and a connection supporting member having one end screwed with the external thread portion and the other end coupled to the biasing means.Type: GrantFiled: August 3, 2021Date of Patent: February 6, 2024Assignee: MITUTOYO CORPORATIONInventors: Yuichi Ichikawa, Osamu Saito
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Publication number: 20240035816Abstract: An automatic measuring device includes a micrometer including a spindle that moves forward and backward to be brought into contact with or away from a workpiece and a displacement detector unit that detects displacement of the spindle, and an automatic operation unit that automates the forward and backward movement of the spindle by power. The automatic operation unit performs a first forward-movement step of moving the spindle forward to bring the spindle into contact with the workpiece, and a contact determination step of determining the contact between the spindle and the workpiece in the first forward-movement step. In the contact determination step, the spindle is determined to be in contact with the workpiece when a change in a position of the spindle detected by the displacement detector unit in the first forward-movement step becomes equal to or less than a predetermined contact determination threshold.Type: ApplicationFiled: July 27, 2023Publication date: February 1, 2024Applicant: MITUTOYO CORPORATIONInventors: Keita OGAWA, Shuji HAYASHIDA, Masashi YAMAJI
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Patent number: 11885879Abstract: A measurement apparatus includes a laser apparatus, a branch that branches a frequency-modulated laser beam into a reference light and a measurement light, a beat signal generator that generates a beat signal by mixing the reference light and a reflected light that is the measurement light radiated onto an object to be measured, a first analyzer that analyses a first signal component corresponding to a difference in a propagation distance between the reference light and the measurement light on the basis of the beat signal, a second analyzer that analyses a second signal component corresponding to a cavity frequency of an optical cavity on the basis of the beat signal, and calculation circuitry that calculates the difference in the propagation distance between the reference light and the measurement light.Type: GrantFiled: August 19, 2020Date of Patent: January 30, 2024Assignee: Mitutoyo CorporationInventors: Yoshimasa Suzuki, Shinichi Hara, Hiroki Ujihara
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Patent number: 11879975Abstract: A measurement apparatus including: a laser that outputs a frequency-modulated laser beam; a branch that splits the frequency-modulated laser beam into a reference light and a measurement light; a beat signal generator that generates a beat signal by mixing the reference light and a reflected light that is reflected by radiating the measurement light onto an object to be measured; a frequency analyzer that frequency-analyzes the beat signal; a storage that stores a reference frequency signal which is a frequency signal obtained by converting a reference signal output by the beat signal generator in a state without the object to be measured; and calculation circuitry that calculates a difference between propagation distances of the reference light and the measurement light.Type: GrantFiled: August 9, 2021Date of Patent: January 23, 2024Assignee: Mitutoyo CorporationInventors: Shinji Komatsuzaki, Yoshimasa Suzuki, Tomotaka Takahashi
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Patent number: 11867809Abstract: A measurement apparatus includes a laser apparatus, a branching part that branches a frequency-modulated laser beam output by the laser apparatus into a reference light and a measurement light; a beat signal generation part that generates a beat signal by mixing a reflected light and the reference light, a conversion part that converts the beat signal into a digital signal at a first sampling rate and frequency-analyses it, an extraction part that extracts a signal component corresponding to a cavity frequency from the frequency-modulated laser beam, a digital filter that digitally filters the extracted signal component at a second sampling rate; and a calculation part that calculates a difference in a propagation distance between the reference light and the measurement light.Type: GrantFiled: July 6, 2020Date of Patent: January 9, 2024Assignee: Mitutoyo CorporationInventors: Yoshimasa Suzuki, Shinichi Hara, Shinji Komatsuzaki, Ryusuke Kato, Hiroki Ujihara, Masayuki Nara, Tomotaka Takahashi
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Patent number: 11860602Abstract: A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a user interface with a simulation portion (e.g., including a 3D view of a workpiece) and an editing user interface portion (e.g., including an editable plan representation of a current workpiece feature inspection plan). Transparency operations are performed including automatically identifying as a target feature a workpiece feature in the 3D view that corresponds to a workpiece feature or inspection operation representation in the editable plan representation that is indicated by a current feature-directed operation (e.g., a selection operation for selecting a workpiece feature or inspection operation in the editable plan representation). An occluding workpiece feature that would otherwise be occluding at least a portion of the target feature in the 3D view is then automatically rendered as at least partially transparent in the 3D view.Type: GrantFiled: December 10, 2018Date of Patent: January 2, 2024Assignee: Mitutoyo CorporationInventors: Dahai Yu, Barry Saylor, Kai Kircher
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Patent number: D1008057Type: GrantFiled: December 10, 2021Date of Patent: December 19, 2023Assignee: MITUTOYO CORPORATIONInventors: Kenji Iwamoto, Yuichi Kikuchi, Masanori Seki
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Patent number: D1009113Type: GrantFiled: November 26, 2021Date of Patent: December 26, 2023Assignee: MITUTOYO CORPORATIONInventors: Kenji Iwamoto, Yasushi Fukumoto, Takashi Honma
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Patent number: D1012740Type: GrantFiled: April 14, 2022Date of Patent: January 30, 2024Assignee: MITUTOYO CORPORATIONInventors: Keiji Yamada, Kazuki Fujita, Takayuki Yonezawa, Shigemitsu Aoki
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Patent number: D1013539Type: GrantFiled: April 14, 2022Date of Patent: February 6, 2024Assignee: MITUTOYO CORPORATIONInventors: Keiji Yamada, Kazuki Fujita, Takayuki Yonezawa, Shigemitsu Aoki
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Patent number: D1020744Type: GrantFiled: February 17, 2021Date of Patent: April 2, 2024Assignee: MITUTOYO CORPORATIONInventors: Keisuke Iori, Aoi Shimizu